The 3rd VI-grade Conference, which took place on October 13th-14th, 2010 in Bad Nauheim, Germany, was dedicated to all upcoming development challenges and opportunities today’s engineers and developers face. 
120 engineers, managers, and simulation experts from more than 50 companies and research centers gathered from all over the world to discuss the latest simulation trends and to exchange their experience with other users of the VI-grade technology during the event that took place on October 13th – 14th, 2010 in Bad Nauheim, Germany. The event, characterized by the motto “Visualize Future Challenges Today”, offered to the participants a very comprehensive agenda, featuring 35 presentations and 5 workshops dedicated to the latest technology in advanced system simulation in the following industries: Automotive, Motorsports, Motorcycle, Aerospace, Rail, Real Time, Controls, Driver-In-the-Loop, Engine, New Drive Concept.
"Thanks for a wonderful conference!" said one of the participants from the automotive industry. "I could learn a lot about the latest trends and works done by European OEMs, especially in the area of vehicle dynamics." Another participant from the automotive industry added: “I particularly enjoyed all aspects related to SIL / HIL – as well as of course the networking with other manufacturers and suppliers.” A participant from the aircraft industry concluded: “I really enjoyed the conference and the workshops. It was a great experience and I hope there will be more opportunities like this in the future.”
“A special highlight of this year's conference has been the introduction of VI-DriveSim, our revolutionary turnkey solution for testing virtual vehicle missions with a real driver who can ‘feel’ the behavior of the car by driving a highly accurate digital surrogate in a realistic environment” said Diego Minen, Technical Director of VI-grade GmbH. “We have received great reviews about VI-DriveSim by all participants to the event – including major automotive OEMs as well as Tier1 and racecar companies – not only from engineers, but also from test drivers!”
